Measurement Profile of Surface Revolution by Laser Scan Micrometer Method

Authors

  • Le Xuan Cam Msc. School of machanical engineering, Hanoi University of Science and Technology, Vietnam
  • Nguyen Van Vinh Assoc Prof Dr. School of machanical engineering, Hanoi University of Science and Technology, Vietnam
  • Hoang Hong Hai PhD. School of machanical engineering, Hanoi University of Science and Technology, Vietnam

Keywords:

Measurement profile, Surface revolution, Profile of surface revolution, Laser scan micrometer, Mathematical model, Roundness, Straightness

Abstract

Measurement profile of surface revolution by laser scan micrometer method is a non-contact measurement method that allows de-tailed profile measurements with fast measuring speed by using laser scanning and accuracy is much higher than other non-contact scanning methods. This paper presents the mathematical model profile of surface revolution and the application of the laser scan micrometer method for measuring this detailed profile. Fabricating complete equipment model according to the author's proposed method. Compare the results of measuring the profile of surface revolution on a construction measuring device with a roundness meter Jenoptik F315 to prove the feasibility of the construction measurement method.

References

. W. Liu, P. Hu, and K. Fan, “Comparison of current five-point cylindricity error separation techniques,” Applied Sciences (Switzerland), vol. 8, no. 10. MDPI AG, 16-Oct-2018, doi: 10.3390/app8101946.

. K. Endo, W. Gao, and S. Kiyono, “A new multi-probe arrangement for surface profile measurement of cylinders,” JSME Int. Journal, Ser. C Mech. Syst. Mach. Elem. Manuf., vol. 46, no. 4, pp. 1531–1537, 2003, doi: 10.1299/jsmec.46.1531.

. “1-s2.0-S2351978917307151-main.pdf.” .

. B. Muralikrishnan and J. Raja, “Computational surface and roundness metrology,” Computational Surface and Roundness Metrology. pp. 1–263, 2009, doi: 10.1007/978-1-84800-297-5.

. Laser Scan Micrometer– Keyence. Available online:https://www.keyence.com/ss/ products/measure/measurement_library/type/optical/ (accessed on 02 May 2019).

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Published

2020-04-10

How to Cite

Cam, L. X. ., Vinh, N. V. ., & Hai, H. H. . (2020). Measurement Profile of Surface Revolution by Laser Scan Micrometer Method. American Scientific Research Journal for Engineering, Technology, and Sciences, 67(1), 36–44. Retrieved from https://asrjetsjournal.org/index.php/American_Scientific_Journal/article/view/5823

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Articles