Cam, L.X. , Vinh, N.V. and Hai, H.H. (2020) “Measurement Profile of Surface Revolution by Laser Scan Micrometer Method”, American Scientific Research Journal for Engineering, Technology, and Sciences, 67(1), pp. 36–44. Available at: https://asrjetsjournal.org/American_Scientific_Journal/article/view/5823 (Accessed: 14 September 2025).