CAM, Le Xuan; VINH, Nguyen Van; HAI, Hoang Hong. Measurement Profile of Surface Revolution by Laser Scan Micrometer Method. American Scientific Research Journal for Engineering, Technology, and Sciences, Jordan, v. 67, n. 1, p. 36–44, 2020. Disponível em: https://asrjetsjournal.org/American_Scientific_Journal/article/view/5823. Acesso em: 14 sep. 2025.